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Optical Engineering

Measurement Of The Emissivity Of Small Particles At Elevated Temperatures
Author(s): J. R. Fincke; C. L. Jeffery; R. Erik Spjut
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Paper Abstract

A technique for measuring the emissivity of single, nominally 50-µm-sized tungsten particles at elevated temperatures is demonstrated. Single particles are electrodynamically suspended in the cavity of a cw Nd:YAG laser and subsequently heated by the laser beam. The light emitted by the heated particles is focused onto the slit of a spectrometer. The detector used is an intensified gatable diode array that allows for the collection of time-resolved spectral data. Spectral radiance is deduced by calibrating the system against a standard lamp. Assuming that the relationship between emissivity and wavelength is a smooth function, the particle temperature and emissivity are determined by a curve-fitting procedure involving Planck's spectral radiation law. Experimental demonstration and error estimates of the technique are presented.

Paper Details

Date Published: 1 August 1988
PDF: 7 pages
Opt. Eng. 27(8) 278684 doi: 10.1117/12.7976741
Published in: Optical Engineering Volume 27, Issue 8
Show Author Affiliations
J. R. Fincke, EG&G Idaho, Inc. (United States)
C. L. Jeffery, EG&G Idaho, Inc. (United States)
R. Erik Spjut, Massachusetts Institute of Technology (United States)

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