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Optical Engineering

Compressive Creep Strain Measurements Using Moire Interferometry
Author(s): M. E. Tuttle; R. J. Klein
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Paper Details

Date Published: 1 August 1988
PDF: 6 pages
Opt. Eng. 27(8) doi: 10.1117/12.7976734
Published in: Optical Engineering Volume 27, Issue 8
Show Author Affiliations
M. E. Tuttle, University of Washington (United States)
R. J. Klein, University of Washington (United States)

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