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Optical Engineering

Fast Optical Detector Deposited On Dielectric Channel Waveguides
Author(s): Donald R. Larson; Robert J. Phelan, Jr.
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Paper Abstract

We have fabricated a thin-film optical detector for detecting short optical pulses propagating in channel waveguides. The detectors show response times of 200 ps full width at half maximum amplitude when illuminated by guided, subpicosecond optical pulses. The detectors are formed by depositing hydrogenated amorphous silicon (a-Si:H) directly on the dielectric channel waveguides. Back-to-back Schottky photodiodes are then formed when interdigitated chrome-gold metal contacts are deposited on the a-Si:H.

Paper Details

Date Published: 1 June 1988
PDF: 4 pages
Opt. Eng. 27(6) 276503 doi: 10.1117/12.7976711
Published in: Optical Engineering Volume 27, Issue 6
Show Author Affiliations
Donald R. Larson, National Bureau of Standards (United States)
Robert J. Phelan, Jr., National Bureau of Standards (United States)


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