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Optical Engineering

Instrumentation To Measure The Diffuse Thickness Of Scattering Dispersions
Author(s): Gerald S. Birth; Per-Gunnar Fyhn; Joseph Frank
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Paper Abstract

An instrument has been developed for measuring the light scattering associated with diffuse reflectance measurements. The instrument measures the sample thickness necessary to bring about diffusion of the transmitted radiation, i.e., the diffuse thickness. This quantity is inversely proportional to the light scattering coefficient as defined by the Kubelka-Munk equations. Results have shown the measurement to be independent of absorption and inversely proportional to particle density in the sample.

Paper Details

Date Published: 1 May 1988
PDF: 6 pages
Opt. Eng. 27(5) 275403 doi: 10.1117/12.7976690
Published in: Optical Engineering Volume 27, Issue 5
Show Author Affiliations
Gerald S. Birth, U.S. Department of Agriculture (United States)
Per-Gunnar Fyhn, Landteknikk (Norway)
Joseph Frank, University of Georgia (United States)

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