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Optical Engineering

Long-Distance Electronic Speckle Pattern Interferometry
Author(s): Ole J. Lokberg; Jan T. Malmo
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Paper Details

Date Published: 1 February 1988
PDF: -149 pages
Opt. Eng. 27(2) doi: 10.1117/12.7976660
Published in: Optical Engineering Volume 27, Issue 2
Show Author Affiliations
Ole J. Lokberg, The Norwegian Institute of Technology (Norway)
Jan T. Malmo, Foundation of Scientific and Industrial Research (SINTEF) (Norway)


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