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Optical Engineering

Layered Synthetic Microstructure X-Ray Mirror Focusing Instrument: Bent Silicon Wafer Substrate
Author(s): J. A. Penkethman
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Paper Details

Date Published: 1 February 1988
PDF: 5 pages
Opt. Eng. 27(2) doi: 10.1117/12.7976652
Published in: Optical Engineering Volume 27, Issue 2
Show Author Affiliations
J. A. Penkethman, Advanced Research and Applications Corporation (ARACOR) (United States)


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