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Optical Engineering

Stray Light Measurement For Imaging Systems
Author(s): Joseph M. Yaeli
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Paper Abstract

Measurement of the line spread function of a black slit against an extended illuminated background detects the existence of stray light in the measured system. This method is useful for imaging systems since it is directly related to the modulation transfer function. The method is described in detail, a figure of merit is introduced, and an example of the use of the method is shown.

Paper Details

Date Published: 1 January 1988
PDF: 2 pages
Opt. Eng. 27(1) doi: 10.1117/12.7976646
Published in: Optical Engineering Volume 27, Issue 1
Show Author Affiliations
Joseph M. Yaeli, Elbit (Israel)


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