Share Email Print
cover

Optical Engineering

New Correlation For On-Line Film Thickness Measurement
Author(s): Roger F. Edgar; Peter H. Hindle
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 January 1988
PDF: 5 pages
Opt. Eng. 27(1) doi: 10.1117/12.7976641
Published in: Optical Engineering Volume 27, Issue 1
Show Author Affiliations
Roger F. Edgar, Infrared Engineering Limited (England)
Peter H. Hindle, Infrared Engineering Limited (England)


© SPIE. Terms of Use
Back to Top