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Optical Engineering

New Correlation For On-Line Film Thickness Measurement
Author(s): Roger F. Edgar; Peter H. Hindle
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Paper Details

Date Published: 1 January 1988
PDF: 5 pages
Opt. Eng. 27(1) doi: 10.1117/12.7976641
Published in: Optical Engineering Volume 27, Issue 1
Show Author Affiliations
Roger F. Edgar, Infrared Engineering Limited (England)
Peter H. Hindle, Infrared Engineering Limited (England)

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