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Optical Engineering

Imaging And Nondispersive Spectroscopy Of Soft X Rays Using A Laboratory X-Ray Charge-Coupled-Device System
Author(s): Gerard A. Luppino; Natale M. Ceglio; John P. Doty; George R. Ricker; John V. Vallerga
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Paper Abstract

This paper describes the design and performance of a laboratory instrument for imaging and nondispersive spectroscopy of soft x rays (300 eV to 10 keV) utilizing the Texas Instruments TI-4849 virtual-phase CCD. This instrument has achieved a spatial resolution of 22 p.m (limited by pixel size) with an overall array area of 584x390 pixels. It has achieved an energy resolution of ~140 eV FWHM for single-pixel 55Fe x-ray events (5.9 keV) with the CCD operated at -30°C. We have operated the CCD in photon-counting mode at room temperature and have obtained x-ray spectra with an energy resolution of ~450 eV at 5.9 keV. The low energy x-ray sensitivity of the CCD also has been demonstrated by detecting carbon Ka x rays (277 eV).

Paper Details

Date Published: 1 October 1987
PDF: 7 pages
Opt. Eng. 26(10) 261048 doi: 10.1117/12.7974193
Published in: Optical Engineering Volume 26, Issue 10
Show Author Affiliations
Gerard A. Luppino, Massachusetts Institute of Technology (United States)
Natale M. Ceglio, Lawrence Livermore National Laboratory (United States)
John P. Doty, Massachusetts Institute of Technology (United States)
George R. Ricker, Massachusetts Institute of Technology (United States)
John V. Vallerga, Massachusetts Institute of Technology (United States)


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