Share Email Print

Optical Engineering

Ultimate Sensitivity And Resolution Of Phosphor/Fiber/Charge-Coupled-Device Systems
Author(s): Mark E. Dunham; Philip G. Sanchez
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Charge-coupled-device imagers have great potential to replace photographic film for recording cathode ray tube (CRT) displays. The basic problem, detection of electrons impacting with variable densities on a sensing screen, implies high sensitivity for single-electron detection. Few data have been published on CCD performance in this regime, especially as one component of a complete readout system. We report on the basic sensitivity and resolution of one possible system, the electron beam and phosphor coupled with fiber optics to a thermoelectrically cooled CCD camera. Observed performance indicates that present sensitivity is several CRT beam electrons per pixel and that resolutions of 25 µm trace width present no problem. Improved experiments are expected to yield single-electron detection capability in the near future. The outlook for broad use of this readout in oscilloscopes, streak tubes, and imagers is discussed with regard to this performance.

Paper Details

Date Published: 1 October 1987
PDF: 8 pages
Opt. Eng. 26(10) 261035 doi: 10.1117/12.7974191
Published in: Optical Engineering Volume 26, Issue 10
Show Author Affiliations
Mark E. Dunham, EG&G Energy Measurements, Inc. (United States)
Philip G. Sanchez, EG&G Energy Measurements, Inc. (United States)

© SPIE. Terms of Use
Back to Top