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Optical Engineering

Ultraviolet And Extreme Ultraviolet Response Of Charge-Coupled-Device Detectors
Author(s): R. A. Stern; R. C. Catura; R. Kimble; A. F. Davidsen; M. Winzenread; M. M. Blouke; R. Hayes; D. M. Walton; J. L. Culhane
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Paper Details

Date Published: 1 September 1987
PDF: 9 pages
Opt. Eng. 26(9) doi: 10.1117/12.7974165
Published in: Optical Engineering Volume 26, Issue 9
Show Author Affiliations
R. A. Stern, Lockheed Palo Alto Research Laboratory (United States)
R. C. Catura, Lockheed Palo Alto Research Laboratory (United States)
R. Kimble, The Johns Hopkins University (United States)
A. F. Davidsen, The Johns Hopkins University (United States)
M. Winzenread, Tektronix, Inc. (United States)
M. M. Blouke, Tektronix, Inc. (United States)
R. Hayes, Tektronix, Inc. (United States)
D. M. Walton, Mullard Space Science Laboratory (United Kingdom)
J. L. Culhane, Mullard Space Science Laboratory (United Kingdom)


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