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Optical Engineering

X-Ray Measurements Of Charge Diffusion Effects In EEV Ltd. Charge-Coupled Devices
Author(s): David H. Lumb; Eric G. Chowanietz; Alan Walls
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Paper Details

Date Published: 1 August 1987
PDF: 6 pages
Opt. Eng. 26(8) doi: 10.1117/12.7974148
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
David H. Lumb, Leicester University (United Kingdom)
Eric G. Chowanietz, Leicester University (United Kingdom)
Alan Walls, Leicester University (United Kingdom)

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