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Optical Engineering

Charge-Coupled-Device X-Ray Detector Performance Model
Author(s): M. W. Bautz; G. E. Berman; J. P. Doty; G. R. Ricker
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Paper Abstract

We describe a model that predicts the performance characteristics of charge-coupled-device (CCD) detectors being developed for use in x-ray imaging. The model accounts for the interactions of both x rays and charged particles with the CCD and simulates the transport and loss of charge in the detector. Predicted performance parameters include detective and net quantum efficiencies, split-event probability, and a parameter characterizing the effective thickness presented by the detector to cosmic-ray protons. The predicted performance of two CCDs of different epitaxial layer thicknesses is compared. The model predicts that in each device incomplete recovery of the charge liberated by a photon of energy between 0.1 and 10 keV is very likely to be accompanied by charge splitting between adjacent pixels. The implications of the model predictions for CCD data processing algorithms are briefly discussed.

Paper Details

Date Published: 1 August 1987
PDF: 9 pages
Opt. Eng. 26(8) 268757 doi: 10.1117/12.7974146
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
M. W. Bautz, Massachusetts Institute of Technology (United States)
G. E. Berman, Massachusetts Institute of Technology (United States)
J. P. Doty, Massachusetts Institute of Technology (United States)
G. R. Ricker, Massachusetts Institute of Technology (United States)

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