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Optical Engineering

Charge-Coupled-Device X-Ray Detector Performance Model
Author(s): M. W. Bautz; G. E. Berman; J. P. Doty; G. R. Ricker
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Paper Details

Date Published: 1 August 1987
PDF: 9 pages
Opt. Eng. 26(8) doi: 10.1117/12.7974146
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
M. W. Bautz, Massachusetts Institute of Technology (United States)
G. E. Berman, Massachusetts Institute of Technology (United States)
J. P. Doty, Massachusetts Institute of Technology (United States)
G. R. Ricker, Massachusetts Institute of Technology (United States)


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