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Optical Engineering

Characterization Of Electro-Optic Anomalies Associated With Transient Response Of Fast Readout Charge-Coupled Devices
Author(s): George J. Yates; Leland E. Sprouse; Donald R. Myers; Bojan Turko
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Paper Abstract

The salient electro-optic properties of typical Fairchild model 222 interline transfer charge-coupled devices when exposed to single impulses of visible light (100 ps to 10 As) and with subsequent fast single-frame readout (4 ms) are presented. Identification and differentiation between CCD video components arising from the intended image area or photosites and those arising from the vertical registers are discussed, with emphasis on possible ambiguities resulting from improper or random combination of the two components. In addition, CCD/camera signal-to-noise ratio and resolution as functions of readout rate and spectral input are included. Fast readout philosophy, design criteria, and circuitry are discussed.

Paper Details

Date Published: 1 August 1987
PDF: 10 pages
Opt. Eng. 26(8) doi: 10.1117/12.7974145
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
George J. Yates, Los Alamos National Laboratory (United States)
Leland E. Sprouse, Los Alamos National Laboratory (United States)
Donald R. Myers, Los Alamos National Laboratory (United States)
Bojan Turko, Lawrence Berkeley Laboratory (United States)


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