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Optical Engineering

Characterization Of Electro-Optic Anomalies Associated With Transient Response Of Fast Readout Charge-Coupled Devices
Author(s): George J. Yates; Leland E. Sprouse; Donald R. Myers; Bojan Turko
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Paper Details

Date Published: 1 August 1987
PDF: 10 pages
Opt. Eng. 26(8) doi: 10.1117/12.7974145
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
George J. Yates, Los Alamos National Laboratory (United States)
Leland E. Sprouse, Los Alamos National Laboratory (United States)
Donald R. Myers, Los Alamos National Laboratory (United States)
Bojan Turko, Lawrence Berkeley Laboratory (United States)


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