Share Email Print

Optical Engineering

Electro-Optical Characterization Of The Tektronix TK512M-011 Charge-Coupled Device
Author(s): Patrick M. Epperson; Jonathan V. Sweedler; M. Bonner Denton; Gary R. Sims; Thomas W. McCurnin; Richard S. Aikens
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The electro-optical characterization of the first in a new series of Tektronix CCDs is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 um pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge-transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD output FET are reported. The TK512M-011 has excellent photometric lin-earity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction; however, CTE problems are observed in the serial direction. The quantum efficiency of the front-side-illuminated CCD over the wavelength range of 400 to 1000 nm is lower than expected based on experience with similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons, depending on the FET operating conditions and system bandwidth. A very small latent image effect is noted. The conclusion of this evaluation is that despite the problems observed, the frontside-illuminated Tektronix CCD is an excellent sensor for scientific imaging applications.

Paper Details

Date Published: 1 August 1987
PDF: 10 pages
Opt. Eng. 26(8) 268715 doi: 10.1117/12.7974140
Published in: Optical Engineering Volume 26, Issue 8
Show Author Affiliations
Patrick M. Epperson, University of Arizona (United States)
Jonathan V. Sweedler, University of Arizona (United States)
M. Bonner Denton, University of Arizona (United States)
Gary R. Sims, Photometrics Ltd. (United States)
Thomas W. McCurnin, Photometrics Ltd. (United States)
Richard S. Aikens, Photometrics Ltd. (United States)

© SPIE. Terms of Use
Back to Top