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Optical Engineering

Current Readout Of Infrared Detectors
Author(s): Nathan Bluzer; Arthur S. Jensen
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Paper Abstract

A buffered direct-injection (BDI) current readout for infrared detectors is described and analyzed. It is compared with the common direct-injection (DI) circuit with respect to injection efficiency, noise, and tolerance of low RoA product photovoltaic detectors. Power requirements and threshold control are also discussed. Throughout the analysis it is clear that much advantage is gained at relatively little cost by the use of a BDI structure for an integrated circuit focal plane.

Paper Details

Date Published: 1 March 1987
PDF: 8 pages
Opt. Eng. 26(3) 263241 doi: 10.1117/12.7974057
Published in: Optical Engineering Volume 26, Issue 3
Show Author Affiliations
Nathan Bluzer, Westinghouse Advanced Technology Division (United States)
Arthur S. Jensen, Westinghouse Advanced Technology Division (United States)

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