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Optical Engineering

Charge-Coupled Device Advances For X-Ray Scientific Applications In 1986
Author(s): James R. Janesick; Tom Elliott; Stewart Collins; Taher Daud; Dave Campbell; Gordon Garmire
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Paper Abstract

A theoretical model is presented that predicts the output response of a thinned CCD to soft x-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for a wide variety of CCD structures, and general conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an Advanced X-ray Astrophysics Facility (AXAF) instrument. We compare the results of the analysis to existing state-of-the-art CCDs and project improvements that will be made in the near future.

Paper Details

Date Published: 1 February 1987
PDF: 11 pages
Opt. Eng. 26(2) 262156 doi: 10.1117/12.7974042
Published in: Optical Engineering Volume 26, Issue 2
Show Author Affiliations
James R. Janesick, California Institute of Technology (United States)
Tom Elliott, California Institute of Technology (United States)
Stewart Collins, California Institute of Technology (United States)
Taher Daud, California Institute of Technology (United States)
Dave Campbell, California Institute of Technology (United States)
Gordon Garmire, Pennsylvania State University (United States)

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