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Optical Engineering

Appraisal Of A New Infrared-Based Stress Analysis Technique
Author(s): P. Stanley
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Paper Abstract

A new and versatile experimental stress analysis technique has recently been developed, based on the measurement of the infrared radiation emitted from the surface of a body as a result of temperature changes caused by cyclic loading within the elastic range ( i.e., the thermoelastic effect). The theory is outlined and the apparatus [referred to as the SPATE (stress pattern analysis by thermal emission) equipment] is described. A number of applications are described to illustrate the principal characteristics of the technique, which is now regarded as a valuable new approach in the stress analysis and design assessment of a wide range of engineering components and structures. Possible future developments in this area are outlined.

Paper Details

Date Published: 1 January 1987
PDF: 6 pages
Opt. Eng. 26(1) 260175 doi: 10.1117/12.7974025
Published in: Optical Engineering Volume 26, Issue 1
Show Author Affiliations
P. Stanley, University of Manchester (United Kingdom)


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