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Optical Engineering

Performance Of A Layered Synthetic Microstructure Spectrogoniometer For Characteristic X-Ray Lines
Author(s): Mohammed Arbaoui; Robert Barchewitz; Jean-Michel Andre; Yves Lepetre; Rene Rivoira
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Paper Abstract

A spectrogoniometer designed to measure the quality of x-ray and XUV dispersive devices is described. The reflectivity of layered synthetic microstructures (LSMs) is presented at three wavelengths (13.3 A, 44.8 A, 67.7 A), corresponding to the emission lines of Cu, C, and B, respectively, emitted from a windowless x-ray tube. In particular, performance of Fabry-Perot etalons in the soft x-ray range is discussed. The observation of the Cu 2p emission spectrum obtained with an optimized LSM dispersor provides a specific example of LSM possibilities for x-ray spectroscopy.

Paper Details

Date Published: 1 November 1986
PDF: 5 pages
Opt. Eng. 25(11) 251207 doi: 10.1117/12.7973983
Published in: Optical Engineering Volume 25, Issue 11
Show Author Affiliations
Mohammed Arbaoui, Universite Pierre et Marie Curie U.A. (France)
Robert Barchewitz, Universite Pierre et Marie Curie U.A. (France)
Jean-Michel Andre, Universite Pierre et Marie Curie U.A. (France)
Yves Lepetre, Universite d'Aix-Marseille III (France)
Rene Rivoira, Universite d'Aix-Marseille III (France)

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