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Optical Engineering

Holographic Optical Interconnects For VLSI
Author(s): L. A. Bergman; W. H. Wu; A. R. Johnston; R. Nixon; Sadik C. Esener; C. C. Guest; P. Yu; Timothy J. Drabik; M. Feldman; Sing H. Lee
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Paper Abstract

This paper introduces new applications and design trade-offs anticipated for free-space optical interconnections of VLSI chips. New implementations of VLSI functions are described that use the capability of making optical inputs at any point on a chip and take advantage of greater flexibility in on-chip signal routing. These include n-port addressable memories, CPU clock phase distribution, hardware multipliers, and dynamic memory refresh, as well as enhanced testability. Fault tolerance and production yields may be improved by reprogramming the optical imaging system to circumvent defective elements. These attributes, as well as those related to performance alone, will affect the design methodology of future VLSI ICs. This paper focuses on identifying the design issues, their possible solutions, and their impact on VLSI design tech-niques and, finally, presents some preliminary measurements on various sys-tem components.

Paper Details

Date Published: 1 October 1986
PDF: 10 pages
Opt. Eng. 25(10) doi: 10.1117/12.7973965
Published in: Optical Engineering Volume 25, Issue 10
Show Author Affiliations
L. A. Bergman, California Institute of Technology (United States)
W. H. Wu, California Institute of Technology (United States)
A. R. Johnston, California Institute of Technology (United States)
R. Nixon, California Institute of Technology (United States)
Sadik C. Esener, University of California, San Diego (United States)
C. C. Guest, University of California, San Diego (United States)
P. Yu, University of California, San Diego (United States)
Timothy J. Drabik, University of California, San Diego (United States)
M. Feldman, University of California, San Diego (United States)
Sing H. Lee, University of California, San Diego (United States)


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