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Optical Engineering

Book Reviews
Author(s): Bruce M. Radl; J. P. Donnelly; Arthur A. Oliner
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Paper Abstract

Laser Beam Scanning: Opto-mechanical devices, systems, and data Storage Optics-Reviewed by Bruce M. Radl; Integrated Optoelectronics-Reviewed by J.P. Donnelly; Planar Circuits for Microwaves and Lightwaves-Reviewed by Arthur A. Oliner;

Paper Details

Date Published: 1 August 1986
PDF: 4 pages
Opt. Eng. 25(8) 258151 doi: 10.1117/12.7973942
Published in: Optical Engineering Volume 25, Issue 8
Show Author Affiliations
Bruce M. Radl, EKTRON Applied Imaging Incorporated (United States)
J. P. Donnelly, M.I.T. Lincoln Laboratory (United States)
Arthur A. Oliner, Polytechnic University (United States)


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