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Optical Engineering

Layered Synthetic Microstructures For Long Wavelength X-Ray Spectrometry
Author(s): J. A. Nicolosi; J. P. Groven; D. Merlo; R. Jenkins
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Paper Details

PDF: 6 pages
Opt. Eng. 25(8) doi: 10.1117/12.7973936
Published in: Optical Engineering Volume 25, Issue 8, August 1986
Show Author Affiliations
J. A. Nicolosi, Philips Electronic Instruments, Inc. (United States)
J. P. Groven, Philips Electronic Instruments, Inc. (United States)
D. Merlo, Philips Electronic Instruments, Inc. (United States)
R. Jenkins, JCPDS-International Center for Diffraction Data (United States)


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