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Optical Engineering

Characterization Of Multilayer X-Ray Analyzers: Models And Measurements
Author(s): B. L. Henke; J. Y. Uejio; H. T. Yamada; R. E. Tackaberry
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Paper Details

Date Published: 1 August 1986
PDF: 11 pages
Opt. Eng. 25(8) doi: 10.1117/12.7973933
Published in: Optical Engineering Volume 25, Issue 8
Show Author Affiliations
B. L. Henke, University of California (United States)
J. Y. Uejio, University of California (United States)
H. T. Yamada, University of California (United States)
R. E. Tackaberry, University of California (United States)


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