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Optical Engineering

Computing X-Ray Reflectance Of Focusing Multilayer Films
Author(s): Dwight W. Berreman
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Paper Details

Date Published: 1 August 1986
PDF: 4 pages
Opt. Eng. 25(8) doi: 10.1117/12.7973932
Published in: Optical Engineering Volume 25, Issue 8
Show Author Affiliations
Dwight W. Berreman, AT&T Bell Laboratories (United States)


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