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Optical Engineering

Speckle Metrology Combined With Finite-Element Modeling For Stress Analysis
Author(s): D. R. Matthys; T. D. Dudderar; J. A. Gilbert; M. A. Taher; H. S. Johnson
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Paper Details

Date Published: 1 June 1986
PDF: 5 pages
Opt. Eng. 25(6) doi: 10.1117/12.7973901
Published in: Optical Engineering Volume 25, Issue 6
Show Author Affiliations
D. R. Matthys, Marquette University (United States)
T. D. Dudderar, AT&T Bell Laboratories (United States)
J. A. Gilbert, University of Alabama in Huntsville (United States)
M. A. Taher, University of Alabama in Huntsville (United States)
H. S. Johnson, University of Alabama in Huntsville (United States)


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