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Optical Engineering

Two-Wavelength Speckle Interferometric Technique For Rough Surface Contour Measurement
Author(s): A. F. Fercher; U. Vry
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Paper Details

Date Published: 1 May 1986
PDF: 4 pages
Opt. Eng. 25(5) doi: 10.1117/12.7973875
Published in: Optical Engineering Volume 25, Issue 5
Show Author Affiliations
A. F. Fercher, University of Essen (Germany)
U. Vry, University of Essen (Germany)


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