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Optical Engineering

Speckle Polarization Investigated By Novel Ellipsometry
Author(s): Joseph Shamir
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Paper Abstract

The polarization characteristics of speckle patterns are investigated by a novel ellipsometric approach. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.

Paper Details

Date Published: 1 May 1986
PDF: 5 pages
Opt. Eng. 25(5) 255618 doi: 10.1117/12.7973874
Published in: Optical Engineering Volume 25, Issue 5
Show Author Affiliations
Joseph Shamir, Technion-lsrael Institute of Technology (Israel)


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