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Optical Engineering

X-Ray Imaging Characteristics Of The Vacuum-Demountable Microchannel Spatial Light Modulator
Author(s): Robert F. Dillon; Cardinal Warde
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Paper Abstract

Preliminary x-ray imaging characteristics of a vacuum-demountable, x-ray sensitive, microchannel spatial light modulator are presented. The measurements include spatial resolution, x-ray exposure sensitivity, framing speed, and built-in image postprocessing capabilities. These results are presented together with a discussion of the principles of operation and the noise performance of the device in the high gain limit.

Paper Details

Date Published: 1 February 1986
PDF: 5 pages
Opt. Eng. 25(2) 252269 doi: 10.1117/12.7973814
Published in: Optical Engineering Volume 25, Issue 2
Show Author Affiliations
Robert F. Dillon, Optron Systems, Inc. (United States)
Cardinal Warde, Massachusetts Institute of Technology (United States)

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