Share Email Print

Optical Engineering

Moire Deflectometry: A Ray Deflection Approach To Optical Testing
Author(s): O. Kafri; I. Glatt
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 December 1985
PDF: 17 pages
Opt. Eng. 24(6) doi: 10.1117/12.7973607
Published in: Optical Engineering Volume 24, Issue 6
Show Author Affiliations
O. Kafri, Nuclear Research Center-Negev (Israel)
I. Glatt, Nuclear Research Center-Negev (Israel)

© SPIE. Terms of Use
Back to Top