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Optical Engineering

Holographic Fringe Linearization Interferometry For Defect Detection
Author(s): G. O. Reynolds; D. A. Servaes; L. Ramos-Izquierdo; J. B. DeVelis; D. C. Peirce; P. D. Hilton; R. A. Mayville
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Paper Details

Date Published: 1 August 1985
PDF: 12 pages
Opt. Eng. 24(5) doi: 10.1117/12.7973572
Published in: Optical Engineering Volume 24, Issue 5
Show Author Affiliations
G. O. Reynolds, Honeywell Electro-Optics Division (United States)
D. A. Servaes, Honeywell Electro-Optics Division (United States)
L. Ramos-Izquierdo, Honeywell Electro-Optics Division (United States)
J. B. DeVelis, Merrimack College (United States)
D. C. Peirce, Arthur D. Little, Inc. (United States)
P. D. Hilton, Arthur D. Little, Inc. (United States)
R. A. Mayville, Arthur D. Little, Inc. (United States)

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