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Optical Engineering

Image Sharpness Enhancement Using Adaptive 3X3 Convolution Masks
Author(s): Robin N. Strickland; Maged Youssef Aly
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Paper Abstract

Biased Laplacian masks are useful for enhancing the sharpness of edges in images degraded by moderate amounts of blur and noise. Further-more, their implementation on pipelined processors is fast and convenient. However, as we show, they become limited by noise very rapidly. The use of a mask whose bias adapts to local variance measured in 3 X3 windows is explored in this paper. Results demonstrate a significant enhancement of the power of biased Laplacian masks.

Paper Details

Date Published: 1 August 1985
PDF: 4 pages
Opt. Eng. 24(4) doi: 10.1117/12.7973552
Published in: Optical Engineering Volume 24, Issue 4
Show Author Affiliations
Robin N. Strickland, University of Arizona (United States)
Maged Youssef Aly, Military Technical College (Egypt)


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