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Optical Engineering

Mapping Of In-Plane Vibration Modes By Electronic Speckle Pattern Interferometry
Author(s): Ole J. Lokberg
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Paper Abstract

The use of a simple tilt procedure in electronic speckle pattern interferometry (ESPI) for rapid mapping of in-plane vibration modes is explained and demonstrated.

Paper Details

Date Published: 1 April 1985
PDF: 4 pages
Opt. Eng. 24(2) 242356 doi: 10.1117/12.7973484
Published in: Optical Engineering Volume 24, Issue 2
Show Author Affiliations
Ole J. Lokberg, The Norwegian Institute of Technology (Norway)

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