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Optical Engineering

Radiation Threshold Levels For Noise Degradation Of Photodiodes
Author(s): L. W. Aukerman; F. L. Vernon; Y. Song
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Paper Abstract

Space radiation can increase the noise of photodiodes as a result of either a sustained ionizing dose rate effect or displacement damage. Elementary, straightforward models are presented for calculating radiation threshold levels and radiation hit susceptibility. Radiation effects experiments that verify these models are discussed. Calculations for room temperature silicon p-i-n photodetectors, an avalanche photodiode, and a hypothetical cooled staring detector indicate that this damage mechanism should not be ignored for space and nuclear environments.

Paper Details

Date Published: 1 October 1984
PDF: 7 pages
Opt. Eng. 23(5) 235678 doi: 10.1117/12.7973354
Published in: Optical Engineering Volume 23, Issue 5
Show Author Affiliations
L. W. Aukerman, The Aerospace Corporation (United States)
F. L. Vernon, The Aerospace Corporation (United States)
Y. Song, The Aerospace Corporation (United States)

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