Share Email Print

Optical Engineering

Frequency Domain Description Of Interferogram Analysis
Author(s): K. H. Womack
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Interferogram analysis is discussed as a sampling problem using the concepts of Fourier analysis. The relative merits of random, raster, and uniform sampling of a wavefront are examined. A relationship between a global least squares fit and interpolation in the spatial domain and transfer functions in the frequency domain is described.

Paper Details

Date Published: 1 August 1984
PDF: 5 pages
Opt. Eng. 23(4) 234396 doi: 10.1117/12.7973307
Published in: Optical Engineering Volume 23, Issue 4
Show Author Affiliations
K. H. Womack, Eastman Kodak Company (United States)

© SPIE. Terms of Use
Back to Top