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Optical Engineering

Aspherical Surface Testing With Shearing Interferometer Using Fringe Scanning Detection Method
Author(s): Toyohiko Yatagai; Toshio Kanou
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Paper Details

Date Published: 1 August 1984
PDF: 4 pages
Opt. Eng. 23(4) doi: 10.1117/12.7973300
Published in: Optical Engineering Volume 23, Issue 4
Show Author Affiliations
Toyohiko Yatagai, University of Tsukuba (Japan)
Toshio Kanou, Ricoh Co., Ltd. (Japan)

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