Share Email Print
cover

Optical Engineering • Open Access

Guest Editorial: Precision Surface Metrology
Author(s): James C. Wyant

Paper Abstract

During the past two decades there have been many changes in precision surface metrology. The introduction of the laser and the large computer during the 1960s and 1970s produced many changes in testing capabilities and requirements. Several commercial interferometers became available in the 1970s, enabling people who were not necessarily experts in interferometry to use interferometers to produce better optics. Since both buyers and sellers could test optics, the quality of the optics manufactured and sold improved greatly. If a person ordered 1/10 wave optics, he would probably get 1/10 wave or better optics; if he got optics of lower quality, he would know it, and he could prove it and return it.

Paper Details

Date Published: 1 August 1984
PDF: 1 pages
Opt. Eng. 23(4) 234349 doi: 10.1117/12.7973297
Published in: Optical Engineering Volume 23, Issue 4
Show Author Affiliations
James C. Wyant, University of Arizona (United States)


© SPIE. Terms of Use
Back to Top