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Optical Engineering

Practical Design Of Double-Layer Antireflective Coatings For High-Index Substrates
Author(s): I. Lubezky; A. Lubezky
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Paper Abstract

Multilayer designs of antireflective (AR) coatings over high-index substrates are compared to double-layer coatings. Equireflectance contours are computed and presented for double-layer coatings of Si, Ge, CdTe, and ZnSe substrates. It is argued that the large theoretical improvement in the performance of AR coatings when going from double-layer to multilayer design is greatly reduced in practice due to fabrication errors. The contours given here for specific substrates can be used for the design and evaluation of double-layer AR coatings.

Paper Details

Date Published: 1 December 1983
PDF: 3 pages
Opt. Eng. 22(6) 226753 doi: 10.1117/12.7973234
Published in: Optical Engineering Volume 22, Issue 6
Show Author Affiliations
I. Lubezky, University of Rochester (United States)
A. Lubezky, University of Rochester (United States)

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