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Optical Engineering

Multiparametric Detection In Modern Luminescence Spectrometry
Author(s): Chu-Ngi Ho; Mae E. Rollie; Isiah M. Warner
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Paper Abstract

Due to its sensitivity and selectivity, luminescence detection is often the choice in a wide variety of analytical applications. However, until recently only one parameter of luminescence was being monitored in a single experiment, for example, emission spectra scanned at a fixed single excitation wavelength, and decay of luminescence observed at a single wavelength of excitation and emission. In this paper we will present some of the recent developments that provide multiparametric detection of luminescence phenomena, for example, a complete intensity map of phosphorescence, simultaneously, at multiple wavelengths of excitation and emission over time. Another area involves the use of polarized radiation in effecting luminescence detection. We will discuss the instrumentation and data analysis for these kinds of experiments.

Paper Details

Date Published: 1 October 1983
PDF: 5 pages
Opt. Eng. 22(5) 225571 doi: 10.1117/12.7973198
Published in: Optical Engineering Volume 22, Issue 5
Show Author Affiliations
Chu-Ngi Ho, Emory University (United States)
Mae E. Rollie, Emory University (United States)
Isiah M. Warner, Emory University (United States)


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