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Optical Engineering

Some Optical Properties Of Materials Measured At 1.3 µm
Author(s): Nils C. Fernelius; Richard J. Harris; David B. O'Quinn; Michael E. Gangl; David V. Dempsey; Walter L. Knecht
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Paper Details

Date Published: 1 August 1983
PDF: 8 pages
Opt. Eng. 22(4) doi: 10.1117/12.7973136
Published in: Optical Engineering Volume 22, Issue 4
Show Author Affiliations
Nils C. Fernelius, University of Dayton Research Institute (United States)
Richard J. Harris, University of Dayton Research Institute (United States)
David B. O'Quinn, University of Dayton Research Institute (United States)
Michael E. Gangl, University of Dayton Research Institute (United States)
David V. Dempsey, University of Dayton Research Institute (United States)
Walter L. Knecht, Air Force Wright Aeronautical Laboratories (United States)


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