Share Email Print

Optical Engineering

Detection of thickness uniformity of film layers in semiconductor devices by spatially resolved ellipso-interferometry
Author(s): Teruhito Mishima; Kwan C. Kao
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

New spatially resolved ellipso-interferometry has been developed on the basis of the principle that spatially and temporally coherent light reflected from the two surfaces of a thin solid film will interfere to form a two-dimensional fringe pattern which is directly related to the spatial distribution of the film thickness if the optical constants are uniformly distributed. This technique differs from the conventional ellipsometry and interferometry in that the new ellipso-interferometer can be used to map the thickness distribution of a whole thin film without involving the use of any scanning technique, and in that its spatial resolution is high and can reach the diffraction-limited resolution under certain conditions. In this paper the principle and the applications of this technique are described, and some experimental results are presented to demonstrate the use of this technique for checking the thickness uniformity of oxide layers in semiconductor devices. This new technique is nondestructive, and the time required for this kind of measurement is much less than that by any other conventional technique.

Paper Details

Date Published: 1 December 1982
PDF: 5 pages
Opt. Eng. 21(6) 216074 doi: 10.1117/12.7973036
Published in: Optical Engineering Volume 21, Issue 6
Show Author Affiliations
Teruhito Mishima, University of Manitoba (Canada)
Kwan C. Kao, University of Manitoba (Canada)

© SPIE. Terms of Use
Back to Top