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Optical Engineering

Cavity Phase Shift Method For High Reflectance Measurements At Mid-Infrared Wavelengths
Author(s): Munson A. Kwok; John M. Herbelin; Robert H. Ueunten
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Paper Abstract

The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 micrometers wavelength is described. A reflectance of 0.9920±0.0050 has been measured.

Paper Details

Date Published: 1 December 1982
PDF: 4 pages
Opt. Eng. 21(6) 216979 doi: 10.1117/12.7973018
Published in: Optical Engineering Volume 21, Issue 6
Show Author Affiliations
Munson A. Kwok, The Aerospace Corporation (United States)
John M. Herbelin, The Aerospace Corporation (United States)
Robert H. Ueunten, The Aerospace Corporation (United States)

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