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Optical Engineering

New Absolute Reflectometer
Author(s): K. AI-Marzouk; M. Jacobson; R. Parks; M. Rodgers
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Paper Abstract

An instrument has been developed for measuring absolute reflectance at near normal incidence in the infrared region of the spectrum. The basic design of the instrument is similar to the Bennett absolute reflectometer except for some differences in implementation. The major sources of systematic errors have been reduced or eliminated. The alignment procedure is described.

Paper Details

Date Published: 1 December 1982
PDF: 3 pages
Opt. Eng. 21(6) 216976 doi: 10.1117/12.7973017
Published in: Optical Engineering Volume 21, Issue 6
Show Author Affiliations
K. AI-Marzouk, University of Arizona (United States)
M. Jacobson, University of Arizona (United States)
R. Parks, University of Arizona (United States)
M. Rodgers, University of Arizona (United States)

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