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Optical Engineering

Polarizer-Surface-Analyzer (PSA) Ellipsometry Of Conical Elements
Author(s): J. D. German; T. R. Ferguson; W. P. Latham
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Paper Abstract

A simple polarizer-surface- analyzer (PSA) ellipsometer was assembled to measure reflection coefficients for coated and bare metal conical optical elements. Configuration and alignment problems unique to testing conical elements are described. The method fails to measure the retardance accurately when its value is near zero or r. Measurements are reported for several coated cones tested during a developmental coating program.

Paper Details

Date Published: 1 December 1982
PDF: 3 pages
Opt. Eng. 21(6) 216968 doi: 10.1117/12.7973015
Published in: Optical Engineering Volume 21, Issue 6
Show Author Affiliations
J. D. German, Air Force Weapons Laboratory (United States)
T. R. Ferguson, Air Force Weapons Laboratory (United States)
W. P. Latham, Air Force Weapons Laboratory (United States)


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