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Optical Engineering

Microprocessor-Based Charge Coupled Device (CCD) Test Console
Author(s): E. L. Dereniak; R. A. Bredthauer; E. M. Hicks; J. E. Vicars; R. A. Florence
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Paper Details

Date Published: 1 October 1982
PDF: 3 pages
Opt. Eng. 21(5) doi: 10.1117/12.7973007
Published in: Optical Engineering Volume 21, Issue 5
Show Author Affiliations
E. L. Dereniak, University of Arizona (United States)
R. A. Bredthauer, Ford Aerospace and Communication Corp. (United States)
E. M. Hicks, Rockwell International (United States)
J. E. Vicars, Rockwell International (United States)
R. A. Florence, Rockwell International (United States)

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