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Optical Engineering

Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements
Author(s): Catherine Wykes
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Paper Abstract

Electronic speckle pattern interferometry (ESPI) enables static and dynamic surface displacements to be measured in real time to an accuracy of the order of a wavelength of light. The principles of the technique are outlined and the different configurations of interferometers described. Some applications of the technique are discussed.

Paper Details

Date Published: 1 June 1982
PDF: 7 pages
Opt. Eng. 21(3) doi: 10.1117/12.7972922
Published in: Optical Engineering Volume 21, Issue 3
Show Author Affiliations
Catherine Wykes, Loughborough University of Technology (England)

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