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Optical Engineering

The Development Of Scattered Light Speckle Metrology
Author(s): T. D. Dudderar; P. G. Simpkins
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Paper Abstract

The development of scattered light speckle (SLS) metrology from its inception in 1975 to the present is discussed. Beginning as a technique with potential for determining the state of strain at a point in the interior of a transparent body, refined SLS techniques are now used to measure the entire field of displacement on an interior plane in a transparent solid or the instantaneous field of velocity within a volume of moving liquid.

Paper Details

Date Published: 1 June 1982
PDF: 4 pages
Opt. Eng. 21(3) doi: 10.1117/12.7972921
Published in: Optical Engineering Volume 21, Issue 3
Show Author Affiliations
T. D. Dudderar, Bell Laboratories (United States)
P. G. Simpkins, Bell Laboratories (United States)

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