Share Email Print
cover

Optical Engineering

Shearography: A New Optical Method For Strain Measurement And Nondestructive Testing
Author(s): Y. Y. Hung
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 June 1982
PDF: 5 pages
Opt. Eng. 21(3) doi: 10.1117/12.7972920
Published in: Optical Engineering Volume 21, Issue 3
Show Author Affiliations
Y. Y. Hung, Oakland University (United States)


© SPIE. Terms of Use
Back to Top