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Optical Engineering

Evaluation Experiments On Holographic Storage Of Binary Data In Electro-Optic Crystals
Author(s): J. E. Weaver; T. K. Gaylord
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Paper Abstract

From extensive measurements of diffracted power distributions from binary-data-page holograms, the probabilities of bit error are calculated to be as low as 5 x 10-8 for volume Fourier transform holograms in iron-doped lithium niobate. Results are determined as a function of reference beam angular position for different diffraction efficiencies, for the angularly multiplexed superposition of holograms with dif-ferent angular separations, and for different displacements of the Fourier transform plane from the electro-optic crystal.

Paper Details

Date Published: 1 June 1981
PDF: 8 pages
Opt. Eng. 20(3) doi: 10.1117/12.7972732
Published in: Optical Engineering Volume 20, Issue 3
Show Author Affiliations
J. E. Weaver, Marconi Avionics, Inc. (United States)
T. K. Gaylord, Georgia Institue of Technology (United States)


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