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Optical Engineering

Optical Properties Of Tellurium Films Used For Data Recording
Author(s): Thomas H. Allen; Gary S. Ash
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Paper Details

Date Published: 1 June 1981
PDF: 4 pages
Opt. Eng. 20(3) doi: 10.1117/12.7972725
Published in: Optical Engineering Volume 20, Issue 3
Show Author Affiliations
Thomas H. Allen, Optical Coating Laboratory, Inc. (United States)
Gary S. Ash, CTI-Cryogenics (United States)

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