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Optical Engineering

Modified Bootstrap Sensitometry In Radiography
Author(s): Daniel R. Bednarek; Stephen Rudin
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Paper Details

Date Published: 1 April 1981
PDF: 4 pages
Opt. Eng. 20(2) doi: 10.1117/12.7972703
Published in: Optical Engineering Volume 20, Issue 2
Show Author Affiliations
Daniel R. Bednarek, State University of New York at Buffalo (United States)
Stephen Rudin, State University of New York at Buffalo (United States)


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